Overview

Our DFT services help ensure that a design is not only functionally correct, but also testable, manufacturable, and ready for downstream production requirements. We support DFT activities from early planning through implementation review and validation, with attention to scan strategy, rule compliance, ATPG readiness, memory test support, and test access planning. By addressing DFT concerns early and coordinating closely with design and verification teams, we help reduce late-cycle testability issues and improve overall production readiness.
What We Deliver
Scan architecture planning, scan chain integration review, and scan connectivity verification
DFT rule analysis, controllability and observability review, and violation debugging support
ATPG coordination for stuck-at and transition fault models, pattern review, and validation support
MBIST and LBIST enablement, repair flow coordination, BIST controller support, and test mode verification
Boundary scan and JTAG support including TAP controller verification and pin-level test access planning
Our Process
DFT

Key Features

This service is centered on practical DFT readiness rather than isolated tool execution. The emphasis is on helping teams make sound DFT decisions early, understand the impact of rule violations, and prepare a design for smoother ATPG and manufacturing test activities later in the flow. That means the work is grounded in design context, not treated as a disconnected post-processing step. The offering is particularly useful for teams that need support coordinating scan, ATPG, memory test, and test-access topics across multiple stakeholders. It brings together planning, review, and debugging in a way that improves coverage expectations and reduces the risk of costly late-stage DFT corrections.
Scan architecture planning
ATPG readiness and validation
MBIST and LBIST support
Boundary scan and JTAG integration
DFT rule analysis and debugging
Manufacturing test readiness

Let’s Discuss Your Project

Contact our team to learn how we can help accelerate your semiconductor development